VIDEO
Engineers at MIT have designed an atomic force microscope that scans images 2,000 times faster than existing commercial models. With this new high-speed instrument, the team produced images of chemical processes taking place at the nano-scale at the rate close to real-time video.
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This entry was posted in Hot Wires and tagged AFM , atomic force microscope , camera , electron , MIT , optical by Mike . Bookmark the permalink .
About Mike
Mike Buetow is president of the Printed Circuit Engineering Association (pcea.net). He previously was editor-in-chief of Circuits Assembly magazine, the leading publication for electronics manufacturing, and PCD&F, the leading publication for printed circuit design and fabrication. He spent 21 years as vice president and editorial director of UP Media Group, for which he oversaw all editorial and production aspects. He has more than 30 years' experience in the electronics industry, including six years at IPC, an electronics trade association, at which he was a technical projects manager and communications director. He has also held editorial positions at SMT Magazine, community newspapers and in book publishing. He is a graduate of the University of Illinois.
Follow Mike on Twitter: @mikebuetow
