Can Your Mortality be Modeled with Weibull Distribution?

Folks,

In the last posting we saw how Weibull analysis helped us to determine that SACM lead-free solder (SAC 105 with about 0.1% manganese) has comparable (actually better) thermal cycle performance versus SAC 305 solder.  Software like Minitab will give us even more detailed information about the performance of the solder joints in stress testing as we see in Figure 1.

In addition to the Weibull plot, we also have the Probability Density Function (PDF), the Survival Function and the Hazard Function. The PDF tells us when it is most likely that a test board will fail in a test population, as shown by the inserted red line. We see that it is a little less than 2,000 cycles. The Survival Function shows the percent of surviving test boards. We observe that the expected life (the 50% point) is quite close to the maximum of the PDF. The Hazard Function tells us the rate at which the test boards are dropping out.  It increases with time, but there are few boars left so the PDF drops down at the end of the test, even though the fallout rate is the highest.

It is interesting (and perhaps appropriate in the wake of Halloween) to consider if human mortality follows a Weibull distribution. I used some data for the Centers for Disease Control that are a little over 10 years old for males in the US.  So, the mean life expectancy is a little low at 72 years. (I was a little lazy: the old data were a little easier to work with than new data, some conversions are needed to make it work.) The data appear in Figure 2.

As you can see, just like a solder joint, your life expectancy can be modeled quite well by the Weibull distribution.

Cheers,

Dr. Ron

Why ‘Green Mold’ Might Be Bad for You

Researchers at IMEC have found that quartz-filled compounds used in place of halogen flame retardants in plastic packages lowered the CTE, and the subsequent mismatch in thermal expansion between the package and board is causing solder joint fatigue cracking, researchers found. The investigators are calling this failure mode “Cu lead fatigue fracture.”

Here’s the link: http://circuitsassembly.com/cms/news/12195-paper-halogen-free-packages-reveal-new-failure-mode